Key Advantages:
500nm Spatial Resolution
PrismaXRM achieves the highest spatial resolution available on the market at 500nm (0.5 µm).
Shown below are individual eggs resolved in the eggs sacks of a daphnia (water flea) specimen.
Novel Multi-Spectral Imaging Enables Maximum Versatility
PrismaXRM was engineered to address the needs of busy central research facilities, which encounter a wide variety of sample shapes, sizes, and composition. The research facilities are often tasked with imaging the samples at the best quality and at the fastest acquisition times. Because no single set of components can address the full range, PrismaXRM can incorporate multiple x-ray sources and detectors into a single system. One key option is a Multi-Spectral Source (MSS) that is also used in Sigray’s ChromaXRM system. This source provides multiple quasi-monochromatic beams of x-rays (unlike the polychromatic x-rays produced by most system’s sources) to provide the outstanding contrast needed for extremely challenging samples, such as low-Z structures in novel lithium battery concepts and biological samples.
PrismaXRM-810 can incorporate the patented Multi-Spectral Source used in the Sigray ChromaXRM-500,
which provides outstanding contrast for challenging samples because it produces quasi-monochromatic x-rays.
Quantitative Phase
PrismaXRM offers both Quantitative Phase and propagation phase contrast capabilities. Unlike propagation phase contrast, which is an edge-enhancing technique, Quantitative Phase provides direct access to the refractive index of a material, allowing decoupling of the material’s atomic number (Z) from its density. This complements absorption contrast which is a convolution of Z and density. Quantitative Phase also provides excellent performance for biological materials and polymers – and is particularly sensitive to voids and cracks.
Multiple Fields of View with Integrated Detectors
Multiple detector configuration options are available within the same system, enabling selection between multiple resolution and field-of-view settings analogous to a visible light microscope.
Semiconductor Failure Analysis
3D x-ray microscopy has become the workhorse approach to investigating failures such as cracks and voids in semiconductor packaging. Sigray PrismaXRM offers the leading resolution, contrast, and resolution needed for quickly identifying the failure modes. In addition, the system’s novel tri-contrast enables rapid identification from a 2D radiography – without requiring a complete tomography.
Virtual slice of logic routing and vias of commercial SDD
Carbon Fiber Reinforced Composites
Carbon fiber reinforced polymers (CFRPs) are extremely challenging to image with conventional x-ray techniques, such as microCT, due to the low absorption of carbon fibers and the surrounding polymer matrix. Quantitative Phase™ and Subresolution Darkfield™ images acquired with the PrismaXRM provide measurements of defects and fiber orientation that cannot be observed using high-resolution absorption contrast, due to the low x-ray contrast between carbon fibers and polymers.
Demonstration of the power of the Quantitative Phase and Subresolution Darkfield capabilities applied to an angle-interlock woven CFRP. All three images were acquired simultaneously in the PrismaXRM. Absorption contrast (what is acquired with conventional microCT) has limited contrast, while the other two images provide information on materials, weaves, and fiber orientations.
In-situ Microstructural Evolution
A significant advantage of PrismaXRM’s design is to retain high submicron resolutions for large samples, enabling high fidelity imaging of samples placed in larger in-situ cells. The 3D microstructural evolution can be imaged of samples under various conditions, including: heating, cooling, tension & compression, and more. We will provide robust in-situ solutions for your needs.
